Hallo,
aktuell kein Email darum auf diesem Weg. Nach dem Tausch der einen Festplatte ist nun auch die zweite abgerauscht, siehe smart output unten. Können Sie diese auch umtauschen ?
Merci!
Server 85.31.186.8
85-31-186-8_rescue ~ # smartctl -d ata -a /dev/sdb
smartctl version 5.36 [x86_64-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is
http://smartmontools.sourceforge.net/=== START OF INFORMATION SECTION ===
Device Model: ExcelStor Technology J8160S
Serial Number: PVB300Q407196A
Firmware Version: P22OA50U
User Capacity: 164,696,555,520 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1
Local Time is: Fri Jun 1 05:18:52 2007 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (2865) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 48) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 058 058 016 Pre-fail Always - 218702301
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 125 125 024 Pre-fail Always - 158 (Average 160)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 30
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 4
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 3186
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 30
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 162
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 162
194 Temperature_Celsius 0x0002 153 153 000 Old_age Always - 39 (Lifetime Min/Max 10/73)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 5
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 19 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 19 occurred at disk power-on lifetime: 3181 hours (132 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 7c 5b a3 63 ea Error: UNC 124 sectors at LBA = 0x0a63a35b = 174302043
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 f0 e7 a0 63 e0 08 5d+08:44:20.500 READ DMA EXT
25 00 f0 e7 a0 63 e0 08 5d+08:44:15.400 READ DMA EXT
25 00 f0 e7 a0 63 e0 08 5d+08:44:10.100 READ DMA EXT
25 00 f0 e7 a0 63 e0 08 5d+08:44:05.000 READ DMA EXT
25 00 f0 e7 a0 63 e0 08 5d+08:43:59.800 READ DMA EXT
Error 18 occurred at disk power-on lifetime: 3181 hours (132 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 7c 5b a3 63 ea Error: UNC 124 sectors at LBA = 0x0a63a35b = 174302043
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 f0 e7 a0 63 e0 08 5d+08:44:15.400 READ DMA EXT
25 00 f0 e7 a0 63 e0 08 5d+08:44:10.100 READ DMA EXT
25 00 f0 e7 a0 63 e0 08 5d+08:44:05.000 READ DMA EXT
25 00 f0 e7 a0 63 e0 08 5d+08:43:59.800 READ DMA EXT
25 00 f8 df a0 63 e0 08 5d+08:43:54.700 READ DMA EXT
Error 17 occurred at disk power-on lifetime: 3181 hours (132 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 7c 5b a3 63 ea Error: UNC 124 sectors at LBA = 0x0a63a35b = 174302043
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 f0 e7 a0 63 e0 08 5d+08:44:10.100 READ DMA EXT
25 00 f0 e7 a0 63 e0 08 5d+08:44:05.000 READ DMA EXT
25 00 f0 e7 a0 63 e0 08 5d+08:43:59.800 READ DMA EXT
25 00 f8 df a0 63 e0 08 5d+08:43:54.700 READ DMA EXT
25 00 f8 df a0 63 e0 08 5d+08:43:49.500 READ DMA EXT
Error 16 occurred at disk power-on lifetime: 3181 hours (132 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 7c 5b a3 63 ea Error: UNC 124 sectors at LBA = 0x0a63a35b = 174302043
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 f0 e7 a0 63 e0 08 5d+08:44:05.000 READ DMA EXT
25 00 f0 e7 a0 63 e0 08 5d+08:43:59.800 READ DMA EXT
25 00 f8 df a0 63 e0 08 5d+08:43:54.700 READ DMA EXT
25 00 f8 df a0 63 e0 08 5d+08:43:49.500 READ DMA EXT
25 00 f8 df a0 63 e0 08 5d+08:43:44.400 READ DMA EXT
Error 15 occurred at disk power-on lifetime: 3181 hours (132 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 7c 5b a3 63 ea Error: UNC 124 sectors at LBA = 0x0a63a35b = 174302043
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 f0 e7 a0 63 e0 08 5d+08:43:59.800 READ DMA EXT
25 00 f8 df a0 63 e0 08 5d+08:43:54.700 READ DMA EXT
25 00 f8 df a0 63 e0 08 5d+08:43:49.500 READ DMA EXT
25 00 f8 df a0 63 e0 08 5d+08:43:44.400 READ DMA EXT
25 00 f8 df a0 63 e0 08 5d+08:43:39.000 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.