Hallo liebes Euserv Team,
Wir haben seit einiger Zeit das Problem, dass alles relativ träge wurde. I/O sind auch extrem gestiegen.
Nun haben wir heute mit Smartctl 2 Tests gemacht:
/dev/sdb:
=== START OF INFORMATION SECTION ===
Device Model: Hitachi HDS721010DLE630
Serial Number: MSE5215V08RKNE
Firmware Version: MS2OA5Q0
User Capacity: 1,000,204,886,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Sun Jul 22 22:35:45 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x85) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (7847) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 131) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 140 140 054 Pre-fail Offline - 76
3 Spin_Up_Time 0x0007 127 127 024 Pre-fail Always - 180 (Average 180)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 38
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 113 113 020 Pre-fail Offline - 35
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 4828
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 38
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 179
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 179
194 Temperature_Celsius 0x0002 206 206 000 Old_age Always - 29 (Lifetime Min/Max 19/32)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 4826 -
# 2 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Also alles ok.
Jetzt hier von /dev/sda:
=== START OF INFORMATION SECTION ===
Device Model: Hitachi HDS721010DLE630
Serial Number: MSE5215V078PLE
Firmware Version: MS2OA5Q0
User Capacity: 1,000,204,886,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Sun Jul 22 22:36:22 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x85) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 121) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: (8332) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 139) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 085 085 016 Pre-fail Always - 2949280
2 Throughput_Performance 0x0005 140 140 054 Pre-fail Offline - 75
3 Spin_Up_Time 0x0007 124 124 024 Pre-fail Always - 185 (Average 185)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 38
5 Reallocated_Sector_Ct 0x0033 001 001 005 Pre-fail Always FAILING_NOW 1606
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 115 115 020 Pre-fail Offline - 34
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 4828
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 38
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 41
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 41
194 Temperature_Celsius 0x0002 206 206 000 Old_age Always - 29 (Lifetime Min/Max 20/32)
196 Reallocated_Event_Count 0x0032 012 012 000 Old_age Always - 1747
197 Current_Pending_Sector 0x0022 001 001 000 Old_age Always - 3656
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1088 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1088 occurred at disk power-on lifetime: 4826 hours (201 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 18 e8 f4 0e 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 08 b6 6c 70 40 08 00:53:54.833 WRITE FPDMA QUEUED
60 80 00 80 f4 0e 40 08 00:53:54.833 READ FPDMA QUEUED
ef 10 02 00 00 00 a0 08 00:53:54.833 SET FEATURES [Reserved for Serial ATA]
27 00 00 00 00 00 e0 08 00:53:54.832 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 08 00:53:54.831 IDENTIFY DEVICE
Error 1087 occurred at disk power-on lifetime: 4826 hours (201 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 18 e8 f4 0e 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 80 08 80 f4 0e 40 08 00:53:52.243 READ FPDMA QUEUED
61 08 00 b6 6c 70 40 08 00:53:52.243 WRITE FPDMA QUEUED
ef 10 02 00 00 00 a0 08 00:53:52.243 SET FEATURES [Reserved for Serial ATA]
27 00 00 00 00 00 e0 08 00:53:52.243 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 08 00:53:52.241 IDENTIFY DEVICE
Error 1086 occurred at disk power-on lifetime: 4826 hours (201 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 18 e8 f4 0e 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 08 b6 6c 70 40 08 00:53:51.031 WRITE FPDMA QUEUED
60 80 00 80 f4 0e 40 08 00:53:51.031 READ FPDMA QUEUED
ef 10 02 00 00 00 a0 08 00:53:51.031 SET FEATURES [Reserved for Serial ATA]
27 00 00 00 00 00 e0 08 00:53:51.031 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 08 00:53:51.029 IDENTIFY DEVICE
Error 1085 occurred at disk power-on lifetime: 4826 hours (201 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 18 e8 f4 0e 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 80 08 80 f4 0e 40 08 00:53:49.454 READ FPDMA QUEUED
61 08 00 b6 6c 70 40 08 00:53:49.454 WRITE FPDMA QUEUED
ef 10 02 00 00 00 a0 08 00:53:49.454 SET FEATURES [Reserved for Serial ATA]
27 00 00 00 00 00 e0 08 00:53:49.454 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 08 00:53:49.452 IDENTIFY DEVICE
Error 1084 occurred at disk power-on lifetime: 4826 hours (201 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 18 e8 f4 0e 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 08 b6 6c 70 40 08 00:53:48.068 WRITE FPDMA QUEUED
60 80 00 80 f4 0e 40 08 00:53:48.068 READ FPDMA QUEUED
ef 10 02 00 00 00 a0 08 00:53:48.068 SET FEATURES [Reserved for Serial ATA]
27 00 00 00 00 00 e0 08 00:53:48.068 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 08 00:53:48.066 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 90% 4826 980200
# 2 Short offline Completed: read failure 50% 4826 980200
# 3 Extended offline Aborted by host 90% 3382 -
# 4 Extended offline Aborted by host 10% 3379 -
# 5 Short offline Completed without error 00% 3376 -
# 6 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Der Teil
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
macht mir sehr sehr viele Sorgen. Mit welchen Tools sollte ich das ganze noch testen bevor ich ein Ticket eröffne?